Flip-flops soft error rate evaluation approach considering internal single-event transient考虑内部 SET的触发器软错误率评估方法

被引：0
作者：
RuiQiang Song
ShuMing Chen
YiBai He
YanKang Du
机构：
[1] National University of Defense Technology,College of Computer Science
[2] Science and Technology on Parallel and Distributed Processing Laboratory,undefined
来源：
Science China Information Sciences | 2015年 / 58卷
关键词：
soft error rate; Monte Carlo; internal SET; single-event upset; flip-flops; 062403;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The internal single-event transient (SET) induced upset in flip-flops is becoming significant with the increase of the operating frequency. However, the conventional soft error rate (SER) evaluation approach could only produce an approximate upset prediction result caused by the internal SET. In this paper, we propose an improved SER evaluation approach based on Monte Carlo simulation. A novel SET-based upset model is implemented in the proposed evaluation approach to accurately predict upsets caused by the internal SET. A test chip was fabricated in a commercial 65 nm bulk process to validate the accuracy of the improved SER evaluation approach. The predicted single-event upset cross-sections are consistent with the experimental data.
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页码：1 / 12
页数：11
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