A review of algorithms to computing irreducible testors applied to feature selection

被引:0
作者
Guillermo Sanchez-Diaz
Manuel S. Lazo-Cortes
Carlos A. Aguirre-Salado
Ivan Piza-Davila
Jorge P. Garcia-Contreras
机构
[1] Universidad Autonoma de San Luis Potosi,
[2] TecNM/Instituto Tecnologico de Tlalnepantla,undefined
[3] Instituto Tecnologico y de Estudios Superiores de Occidente,undefined
来源
Artificial Intelligence Review | 2022年 / 55卷
关键词
Irreducible testor; Typical testor; Feature selection; Testor;
D O I
暂无
中图分类号
学科分类号
摘要
Feature selection is an important task in the areas of pattern recognition and data mining. Various approaches to feature selection have been developed. In particular, this paper focuses on the algorithms for computing irreducible testors, which have been used to solve feature selection problems. The calculation of irreducible testors is an expensive computational process; the complexity of the algorithms to calculate the complete set of irreducible testors exponentially depends on the number of characteristics that describe the objects in the problem. To improve the execution time of these algorithms, different alternatives have been developed, such as parallel implementations, hardware-software implementation, rearrangement of the data, as well as heuristics to generate just an irreducible testor or a subset of the entire set of irreducible testors, among other strategies. This paper presents a review of the literature on irreducible testors, with the aim of providing a guide for researchers working in the areas of pattern recognition and data mining, interested in feature selection, using heterogeneous data and possibly missing data.
引用
收藏
页码:6607 / 6628
页数:21
相关论文
共 129 条
[1]  
Aguila L(1984)MB algorithm for k-valued information elaboration on pattern recognition problems Ciencias Mat J V 89-101
[2]  
Ruiz J(2016)Generating synthetic test matrices as a benchmark for the computational behavior of typical testor-finding algorithms Pattern Recogn Lett 80 46-51
[3]  
Alba-Cabrera E(2019)On the relation between the concepts of irreducible testor and minimal transversal IEEE Access 7 82809-82816
[4]  
Godoy-Calderon S(1966)On finding a nearly minimal set of fault detection tests for combinatorial logic nets IEEE Trans Electron Comput 15 66-73
[5]  
Ibarra-Fiallo J(2004)Construction of all non-reducible descriptors Pattern Recogn 37 1817-1823
[6]  
Alba-Cabrera E(2015)Testor and logic separation in pattern recognition Math Problems Comput Sci 44 33-41
[7]  
Godoy-Calderon S(1983)Algorithm CT for compute of typical test of a k-valued matrix Ciencias Mat J IV 123-144
[8]  
Lazo-Cortés MS(1955)On tests for electric circuits Uspieji Matematicheskij Nauk 4 182-184
[9]  
Martínez-Trinidad JF(1966)About mathematical principles and phenomena classification Diskretni Analiz 7 3-15
[10]  
Carrasco-Ochoa JA(1959)Test routines based on symbolic logic statements J ACM 6 33-36