Yr45, a new wheat gene for stripe rust resistance on the long arm of chromosome 3D

被引:0
作者
Q. Li
X. M. Chen
M. N. Wang
J. X. Jing
机构
[1] Northwest A&F University,College of Plant Protection and Shaanxi Key Laboratory of Molecular Biology for Agriculture
[2] Washington State University,Department of Plant Pathology
[3] Agricultural Research Service,Wheat Genetics, Quality Physiology and Disease Research Unit
[4] US Department of Agriculture,undefined
来源
Theoretical and Applied Genetics | 2011年 / 122卷
关键词
Simple Sequence Repeat Marker; Single Nucleotide Polymorphism; Stripe Rust; Chinese Spring; Stripe Rust Resistance;
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中图分类号
学科分类号
摘要
Stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most destructive diseases of wheat worldwide. Growing resistant cultivars is the most effective approach to control the disease, but only a few genes confer effective all-stage resistance against the current populations of the pathogen worldwide. It is urgent to identify new genes for diversifying sources of resistance genes and for pyramiding genes for different types of resistance in order to achieve high levels of durable resistance for sustainable control of stripe rust. The common spring wheat genotype ‘PI 181434’, originally from Afghanistan, was resistant in all greenhouse and field tests in our previous studies. To identify the resistance gene(s) PI 181434 was crossed with susceptible genotype ‘Avocet Susceptible’. Adult plants of 103 F2 progeny were tested in the field under the natural infection of P. striiformis f. sp. tritici. Seedlings of the parents, F2 and F3 were tested with races PST-100 and PST-127 of the pathogen under controlled greenhouse conditions. The genetic study showed that PI 181434 has a single dominant gene conferring all-stage resistance. Resistance gene analog polymorphism (RGAP) and simple sequence repeat (SSR) techniques were used to identify molecular markers linked to the gene. A linkage map of 8 RGAP and 2 SSR markers was constructed for the gene using data from the 103 F2 plants and their derived F3 lines tested in the greenhouse. Amplification of the complete set of nulli-tetrasomic lines and selected ditelosomic lines of Chinese Spring with an RGAP marker and the two SSR markers mapped the gene on the long arm of chromosome 3D. Because it is the first gene for stripe rust resistance mapped on chromosome 3DL and different from all previously named Yr genes, the gene in PI 181434 was designated Yr45. Polymorphism rates of the two closest flanking markers, Xwgp115 and Xwgp118, in 45 wheat genotypes were 73.3 and 82.2%, respectively. Single nucleotide polymorphisms (SNPs) were identified in the eight wheat genotypes sharing both flanking markers. The RGAP markers and potential SNP markers should be useful in incorporating the gene into wheat cultivars and in pyramiding it with other genes for durable resistance.
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页码:189 / 197
页数:8
相关论文
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