The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation

被引：0
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作者：
M. S. Afanasiev
V. K. Egorov
E. V. Egorov
N. F. Kuharskaya
A. E. Nabiev
V. G. Naryshkina
机构：
[1] Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics,
[2] Russian Academy of Sciences,undefined
[3] Institute of Microelectronics Technology and High Purity Materials,undefined
[4] Russian Academy of Sciences,undefined
[5] Azerbaijan State Pedagogical University,undefined
来源：
Instruments and Experimental Techniques | 2019年 / 62卷
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页码：659 / 663
页数：4
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