Diagnosis of Incipient Faults in Weak Nonlinear Analog Circuits

被引：0
作者：
Yibing Shi
Yong Deng
Wei Zhang
机构：
[1] University of Electronic Science and Technology of China,School of Automation Engineering
[2] Southwest Petroleum University,School of Electronics and Information Engineering
来源：
Circuits, Systems, and Signal Processing | 2013年 / 32卷
关键词：
Weak nonlinear circuits; Incipient fault; Fault diagnosis; Volterra series; Fractional correlation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Aiming at the problem to diagnose incipient faults in weak nonlinear analog circuits, an approach is presented in this paper. The approach calculates the fractional Volterra correlation functions beforehand. The next step is to use the fractional Volterra correlation functions and different angle parameters of the fractional wavelet packet transform (FRWPT) to extract the fault signatures. Meanwhile, the computational complexity is analyzed. Then the variables of the fault signatures are constructed, which are used to form the observation sequences of the hidden Markov model (HMM). HMM is used to accomplish the fault diagnosis. The simulations show that the presented method can significantly improve the incipient fault diagnosis capability.
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页码：2151 / 2170
页数：19
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