Bit patterned media;
Micromagnetism;
Recording media;
Magnetization reversal;
Nanolayers;
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摘要:
The magnetization reversal behavior of a dot array consisting of Co/Pt multilayers with perpendicular magnetic anisotropy was investigated. The size of the dots was varied from 200 nm down to 40 nm, while keeping the filling factor constant at about 0.16. The structural properties were determined by scanning electron microscopy, whereas the magnetic investigation was performed using SQUID and MFM techniques. It was observed that the dot size has a severe impact on the magnetization reversal mechanism where only the smallest dots with a size of 40 nm are found to be in a magnetic single-domain state. Moreover, the patterning process leads to a degradation of the multilayer, leading to a reduction of the switching field and an increase of the switching field distribution with decreasing dot size. In addition, micromagnetic simulations were performed to understand the magnetization reversal mechanism in more detail.
机构:
Univ Transport & Commun, Fac Basic Sci, Hanoi 10000, VietnamUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam
Duy-Truong Quach
Tien-Dung Chu
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Univ Transport & Commun, Fac Basic Sci, Hanoi 10000, VietnamUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam
Tien-Dung Chu
Tuan-Son Nguyen
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机构:
Univ Transport & Commun, Fac Basic Sci, Hanoi 10000, VietnamUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam
Tuan-Son Nguyen
Thi-Thuy-Phuong Doan
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机构:
Univ Transport & Commun, Fac Basic Sci, Hanoi 10000, VietnamUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam
Thi-Thuy-Phuong Doan
Xuan-Tuyen Nguyen
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机构:
Univ Transport & Commun, Fac Basic Sci, Hanoi 10000, VietnamUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam
Xuan-Tuyen Nguyen
Lee, Kyung-Min
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机构:
Chungnam Natl Univ, Dept Mat Sci & Engn, Daejeon 305764, South Korea
Chungnam Natl Univ, Grad Sch Energy Sci & Technol, Daejeon 305764, South KoreaUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam
Lee, Kyung-Min
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Jeong, Jong-Ryul
Kim, Namdong
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机构:
POSTECH, Pohang Accelerator Lab, Pohang 790784, South KoreaUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam
Kim, Namdong
Shin, Hyun-Joon
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机构:
POSTECH, Pohang Accelerator Lab, Pohang 790784, South KoreaUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam
Shin, Hyun-Joon
Kim, Dong-Hyun
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机构:
Chungbuk Natl Univ, Dept Phys, Cheongju 28644, South KoreaUniv Transport & Commun, Fac Basic Sci, Hanoi 10000, Vietnam