On the spherical X-ray wave focusing upon backscattering from a biaxially bent crystal

被引：0

作者：

T. Tchen

机构：

[1] Moscow State Academy of Fine Chemical Technology,

来源：

Technical Physics Letters | 2002年 / 28卷

关键词：

Reflection; Intensity Distribution; Wave Incident; Analytical Formula; Bragg Angle;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

It is shown that a spherical X-ray wave incident at the Bragg angle θB≈π/2 onto a biaxially bent crystal exhibits independent diffraction in two mutually perpendicular planes. An analytical formula for the size of the diffraction reflection region in the backscattering mode is derived and the analytical expression for the wave intensity distribution at the two-dimensional focus is refined.

引用

页码：216 / 217

页数：1