Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level

被引：0

作者：

Stefaan Hoornaert

Boris Treiger

Vlado Valkovic

René Van Grieken

机构：

[1] University of Antwerpen (UIA),Micro

[2] IAEA Laboratories, and Trace Analysis Centre (MiTAC), Department of Chemistry

[3] A. & c.T.,undefined

来源：

Microchimica Acta | 1998年 / 128卷

关键词：

homogeneity; reference materials; electron probe; -ray microanalysis;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

A new approach to the assessment of homogeneity for powder samples of candidate reference materials with the help of electron probeX-ray micro-analysis (EPMA) is proposed. It is based on the utilisation of the Kolmogorov—Smirnov statistics coupled with the Akaike Information Criterion in the processing of the quantitative EPMA data. The evaluation of three IAEA candidate reference materials with the described approach is discussed.

引用

页码：207 / 213

页数：6

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