Application of X-ray computed tomography to analyze the structure of sorghum grain

被引：0
作者：
Daniel Crozier
Oscar Riera-Lizarazu
William L. Rooney
机构：
[1] Texas A&M University,Department of Soil and Crop Sciences
[2] Texas A&M University,Department of Horticultural Sciences
来源：
Plant Methods | / 18卷
关键词：
Grain quality; Grain morphology; Phenotyping; Segmentation; Machine learning; Random forest;
D O I：
暂无
中图分类号：
学科分类号：
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