Application of X-ray computed tomography to analyze the structure of sorghum grain

被引：0

作者：

Daniel Crozier

Oscar Riera-Lizarazu

William L. Rooney

机构：

[1] Texas A&M University,Department of Soil and Crop Sciences

[2] Texas A&M University,Department of Horticultural Sciences

来源：

Plant Methods | / 18卷

关键词：

Grain quality; Grain morphology; Phenotyping; Segmentation; Machine learning; Random forest;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

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