共 11 条
[1]
Rosinger P.(2004)Scan architecture with mutually exclusive scan segment activation for shift- and capture-power reduction IEEE Trans Comput-Aid Design Integ Circ Syst 23 1142-1153
[2]
Al-Hashimi B. M.(2003)Nonscan design for testability for synchronous sequential circuits based on conflict resolution IEEE Trans Comput 52 1063-1075
[3]
Nicolici N.(2009)Low-power scan testing for test data compression using a routing-driven scan architecture IEEE Trans Comput-Aid Design 28 1101-1105
[4]
Xiang D.(2007)Scan cell reordering for peak power reduction during scan test cycles IFIP Int Fed Inf Process 240 267-281
[5]
Fujiwara H.(undefined)undefined undefined undefined undefined-undefined
[6]
Xiang D.(undefined)undefined undefined undefined undefined-undefined
[7]
Hu D.(undefined)undefined undefined undefined undefined-undefined
[8]
Xu Q.(undefined)undefined undefined undefined undefined-undefined
[9]
Badereddine N.(undefined)undefined undefined undefined undefined-undefined
[10]
Girard P.(undefined)undefined undefined undefined undefined-undefined