The scanning tunneling microscopy and scanning tunneling spectroscopy of amorphous carbon

被引：0
作者：
V. I. Ivanov-Omskii
A. B. Lodygin
S. G. Yastrebov
机构：
[1] Russian Academy of Sciences,Ioffe Physicotechnical Institute
来源：
Semiconductors | 2000年 / 34卷
关键词：
Microscopy; Magnetic Material; Field Emission; Electronic Property; Electromagnetism;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The most important methods for studying the surface of amorphous diamond-like carbon are scanning tunneling microscopy and scanning tunneling spectroscopy. In this review, publications concerned with studying the topography and electronic properties of the surface of amorphous diamond-like carbon films using a tunneling microscope are considered; related publications devoted to the microprobe study of field emission from amorphous carbon and to the tunneling microscopy of metal-carbon nanocomposites are also reviewed.
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页码：1355 / 1362
页数：7
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