X-ray topography for fractography of single-crystal components

X-ray diffraction topography is a new tool that may help fractographic analysis of single-crystal structural materials. It is sensitive to local strain and/or crystallographic orientation and provides a unique view of single-crystal samples both before and after fracture. It can find strength-and performance-limiting surface and subsurface flaws that are undetectable by other methods or are detectable only with great difficulty and provides a complementary view of the fracture surface. The attributes of synchrotron-based X-ray topography as applied to fractography are described and illustrated with examples from recent experiments on sapphire.