Intermetallic compounds formed during the interfacial reactions between liquid In-49Sn solder and Ni substrates

被引:0
|
作者
S. S. Wang
Y. H. Tseng
T. H. Chuang
机构
[1] De-Lin Institute of Technology,Department of Mechanical Engineering
[2] Vishay General Semiconductor Taiwan Ltd.,Institute of Materials Science and Engineering
[3] Hsin-Tien,undefined
[4] National Taiwan University,undefined
来源
关键词
In-49Sn/Ni; soldering reaction; ternary Ni; In; Sn; intermetallics; growth kinetics;
D O I
暂无
中图分类号
学科分类号
摘要
The interfacial reactions between liquid In-49Sn solder and Ni substrates at temperatures ranging from 150°C to 450°C for 15 min to 240 min have been investigated. The intermetallic compounds formed at the In-49Sn/Ni interfaces are identified to be a ternary Ni33In20Sn47 phase using electron-probe microanalysis (EPMA) and x-ray diffraction (XRD) analyses. These interfacial intermetallics grow with increasing reaction time by a diffusion-controlled mechanism. The activation energy calculated from the Arrhenius plot of reaction constants is 56.57 kJ/mol.
引用
收藏
页码:165 / 169
页数:4
相关论文
共 50 条
  • [41] Growth mechanisms of interfacial intermetallic compounds in Sn/Cu-Zn solder joints during aging
    Yu, Chi-Yang
    Duh, Jenq-Gong
    JOURNAL OF MATERIALS SCIENCE, 2012, 47 (17) : 6467 - 6474
  • [42] A review on the interfacial intermetallic compounds between Sn-Ag-Cu based solders and substrates
    Zeng, Guang
    Xue, Songbai
    Zhang, Liang
    Gao, Lili
    Dai, Wei
    Luo, Jiadong
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2010, 21 (05) : 421 - 440
  • [43] Interfacial reactions between Sn-3.5Ag solder and electroless Ni-P during soldering and aging
    Huang, Ming-Liang
    Bai, Dong-Mei
    Zhongguo Youse Jinshu Xuebao/Chinese Journal of Nonferrous Metals, 2010, 20 (06): : 1189 - 1194
  • [44] Thermomigration of Cu–Sn and Ni–Sn intermetallic compounds during electromigration in Pb-free SnAg solder joints
    Hsiao-Yun Chen
    Chih Chen
    Journal of Materials Research, 2011, 26 : 983 - 991
  • [45] Correlation between interfacial reactions and mechanical strengths of Sn(Cu)/Ni(P) solder bumps
    S. J. Wang
    H. J. Kao
    C. Y. Liu
    Journal of Electronic Materials, 2004, 33 : 1130 - 1136
  • [46] Interfacial reactions between Sn-3.5 Ag solder and Ni–W alloy films
    A. S. M. A. Haseeb
    C. S. Chew
    Mohd Rafie Johan
    Journal of Materials Science: Materials in Electronics, 2011, 22 : 1372 - 1377
  • [47] Correlation between interfacial reactions and mechanical strengths of Sn(Cu)/Ni(P) solder bumps
    Wang, SJ
    Kao, HJ
    Liu, CY
    JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (10) : 1130 - 1136
  • [48] Interfacial reactions between Sn-Cu based multicomponent solders and Ni substrates during soldering and aging
    Zhao, Ning
    Ma, Hai-tao
    Wang, Lai
    SOLDERING & SURFACE MOUNT TECHNOLOGY, 2009, 21 (02) : 19 - 23
  • [49] Interfacial Reactions of Co-electrodeposited Eutectic Au-Sn Solder Bumps on Ni and Cu Substrates
    Huang, Mingling
    Zhang, Tongxin
    Zhao, Ning
    Jiao, Tingting
    2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2013, : 225 - 228
  • [50] Interfacial reactions between Sn-Cu based multicomponent solders and ni substrates during soldering and aging
    Zhao, Ning
    Ma, Hai-tao
    Wang, Lai
    HDP'07: PROCEEDINGS OF THE 2007 INTERNATIONAL SYMPOSIUM ON HIGH DENSITY PACKAGING AND MICROSYSTEM INTEGRATION, 2007, : 222 - +