Cu–Sn and Ni–Sn transient liquid phase bonding for die-attach technology applications in high-temperature power electronics packaging

被引:1
作者
Byung-Suk Lee
Soong-Keun Hyun
Jeong-Won Yoon
机构
[1] Korea Institute of Industrial Technology (KITECH),Welding and Joining R&D Group
[2] Inha University,Department of Metallurgical Engineering
[3] University of Science and Technology (UST),Critical Materials and Semiconductor Packaging Engineering
来源
Journal of Materials Science: Materials in Electronics | 2017年 / 28卷
关键词
Shear Strength; Bonding Time; Transient Liquid Phase; Cu3Sn IMCs; Transient Liquid Phase Bonding;
D O I
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中图分类号
学科分类号
摘要
Power electronics modules in electric vehicles and hybrid electric vehicles, particularly those containing next-generation power semiconductor devices such as silicon carbide and gallium nitride are operated at high temperatures exceeding 200 °C. Consequently, the reliability requirements for such modules have become highly stringent and new packaging materials and technologies are required to meet the demands of power electronic modules. Some good candidates for high temperature applications include high-temperature solders such as Au–20Sn, Ag or Cu sinter pastes, and transient liquid phase (TLP) bonding materials. In particular, the TLP bonding technology is suitable for use in high temperature environments owing to its low cost and simplicity of the bonding process. In this study, the feasibility of Cu–Sn and Ni–Sn TLP bonding technologies as die-attach methods for power electronics packaging applications is examined. The results of the study indicate that the Cu–Sn and Ni–Sn TLP bonding processes transform the joints fully into Cu6Sn5/Cu3Sn and Ni3Sn4 intermetallic compounds (IMCs), respectively. Further, the mechanical strength and reliability of the two TLP bonding joints are reduced owing to the formation of brittle IMCs.
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页码:7827 / 7833
页数:6
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