Analysis of trace elements in trunk wood by thick-target PIXE using dry ashing for preconcentration

被引：0

作者：

L. Harju

Jan-Olof Lill

Kjell-Erik Saarela

Sven-Johan Heselius

Fredrik Joachim Hernberg

Alf Lindroos

机构：

[1] Department of Analytical Chemistry,

[2] Åbo Akademi University,undefined

[3] FIN-20500 Turku,undefined

[4] Finland,undefined

[5] Accelerator Laboratory,undefined

[6] Åbo Akademi University,undefined

[7] FIN-20500 Turku,undefined

[8] Finland,undefined

[9] Department of Physics,undefined

[10] Åbo Akademi University,undefined

[11] FIN-20500 Turku,undefined

[12] Finland,undefined

[13] Department of Geology and Mineralogy,undefined

[14] Åbo Akademi University,undefined

[15] FIN-20500 Turku,undefined

[16] Finland,undefined

来源：

Fresenius' Journal of Analytical Chemistry | 1997年 / 358卷

关键词：

Certified Reference Material; Wood Sample; Pinus Sylvestris; PIXE; Polluted Area;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Thick-target Particle Induced X-ray Emission (TTPIXE) was used for the quantitative determination of trace-element concentrations in trunk wood. The wood samples were preconcentrated by dry ashing to improve the reliability of the sampling and the sensitivity of the analytical method. Samples of Scots pine (Pinus sylvestris) and Norway spruce (Picea abies) were collected from a polluted area (Harjavalta) as well as from a relatively nonpolluted area (Merimasku) in southwestern Finland. The elements studied were P, S, K, Ca, Mn, Fe, Ni, Cu, Pb, Rb, Sr, Ba, Cd and Ag. TTPIXE combined with dry ashing is a sensitive and reliable analytical technique for most elements studied. The method was validified by using several certified reference materials and also by ICP-MS analysis. Due to the low ash content (0.2–0.4%) in wood a high preconcentration factor can be obtained. Differences in trace-element uptake were observed between the two tree species studied. Trunk wood from the polluted area contained higher concentrations of heavy metal ions.

引用

页码：523 / 528

页数：5