Deep indicator for fine-grained classification of banana’s ripening stages

被引:0
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作者
Yan Zhang
Jian Lian
Mingqu Fan
Yuanjie Zheng
机构
[1] Department of Electrical Engineering Information Technology at Shandong University of Science and Technology,Shandong Normal University
[2] School of Information Science and Engineering,Key Lab of Intelligent Computing and Information Security in Universities of Shandong, Institute of Life Sciences, Shandong Provincial Key Laboratory for Distributed Computer Software Novel Technology
[3] Key Lab of Intelligent Information Processing,undefined
关键词
Image processing; Machine vision; Image classification; Banana; Ripening stage;
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摘要
Determining banana’s ripening stages is becoming an essential requirement for standardizing the quality of commercial bananas. In this paper, we propose a novel convolutional neural network architecture which is designed specifically for the fine-grained classification of banana’s ripening stages. It learns a set of fine-grained image features based on a data-driven mechanism and offers a deep indicator of banana’s ripening stage. The resulted indicator can help to differentiate the subtle differences among subordinate classes of bananas in ripening state. Experimental results from 17,312 images of bananas in different ripening stages show that our deep indicator achieves an accuracy superior significantly to state-of-the-art computer vision-based systems both in rough- and fine-grained classification of ripening stages no matter the bananas bear or not severe defects.
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