Analysis of pure nonferrous and rare metals by atomic emission spectroscopy with photodiode detection

Analytic possibilities of direct determination of impurities in pure nonferrous and rare metals (Ga, In, Cd, Al, Cu, Ni, and Sn) by the arc atomic emission method with application of multichannel atomic emission spectroscopy are studied. The conditions for the performance of the analysis are established. The limits of detection and determination of impurities in studied materials are estimated. The possibility to determine elements at a level of 10−4–10−5 wt % is demonstrated. The accuracy is checked by comparing the obtained results with values of the determined impurities proved by use of state standard reference samples or departmental standard specimens. Improved techniques of arc atomic emission analysis of high purity nonferrous and rare metals are developed. The techniques possess amended metrological characteristics and permit one to considerably reduce the time of carrying out the analysis.