The orientation imaging microscopy of lead-free Sn-Ag solder joints

被引:0
作者
A. U. Telang
T. R. Bieler
机构
[1] Michigan State University,Department of Chemical Engineering and Materials Science
[2] Michigan State University,undefined
来源
JOM | 2005年 / 57卷
关键词
Solder Joint; Coincident Site Lattice; Orientation Imaging Microscopy; Thermomechanical Fatigue; Coincident Site Lattice Boundary;
D O I
暂无
中图分类号
学科分类号
摘要
Orientation imaging microscopy was used to identify solidification microstructures and early stages of damage evolution in tin-silver eutectic solder joints on copper and nickel substrates after aging, creep, and thermomechanical fatigue. A visco-plastic self-consistent plasticity model was able to simulate texture changes when work hardening occurred at higher strain rates, but not with lower rates, where grain boundary sliding dominated the deformation and slip occurred predominantly on one or two slip systems that could be predicted using a Schmid (Sachs) analysis.
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页码:44 / 49
页数:5
相关论文
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