Use of X-ray micro computed tomography imaging to analyze the morphology of wheat grain through its development

被引：0
|
作者：
Thang Duong Quoc Le
Camille Alvarado
Christine Girousse
David Legland
Anne-Laure Chateigner-Boutin
机构：
[1] UR1268 BIA,
[2] INRA,undefined
[3] UMR GDEC,undefined
[4] INRA,undefined
[5] Université Clermont-Auvergne,undefined
来源：
Plant Methods | / 15卷
关键词：
X-ray micro computed tomography; μCT; Image analysis; Wheat; (L.); Grain development;
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