共 75 条
[1]
Stavreva Z(1995)Chemical mechanical polishing of copper for multilevel metallization Appl. Surf. Sci. 91 192-196
[2]
Zeidler D(2004)The combinatorial effect of complexing agent and inhibitor on chemical-mechanical planarization of copper Microelectron. Eng. 71 90-97
[3]
Plotner M(2000)Chemical mechanical planarization of copper damascene structures J Electrochemical Soc 147 706-712
[4]
Drescher K(2002)Study on Cu CMP slurry Res. Progress SSE 22 318-320
[5]
Du T(2017)Integrated effects of colloidal silica abrasives with different particle sizes on copper chemical mechanical planarization Micronanoelectronic Technol 54 58-64
[6]
Luo Y(2016)Study on the effect of the surfactant on the roughness for Cu CMP based on Arrhenius equation Micronanoelectronic Technol 53 822-827
[7]
Desai V(2017)Effects of the polishing pressure and surfactant on the uniformity in copper CMP Semiconductor Technol 42 119-123
[8]
Wrschkaa P(2016)A study on exploring the alkaline copper CMP slurry without inhibitors to achieve high planarization efficiency Microelectronic Eng 160 5-11
[9]
Hernandeza J(2016)Atomistic mechanisms of chemical mechanical polishing of a Cu surface in aqueous H2O2: tight-binding quantum chemical molecular dynamics simulations ACS Appl. Mater. Interfaces. 8 11830-11841
[10]
Wang X(2017)Study on the pH value regulator of ferric chloride based slurry in chemical mechanical polishing 304 stainless steel UPB Scientific Bulletin, Series B 79 179-190