Morphology and conjugation of nanocrystals growing in Cr-O and V-O amorphous films during annealing

被引：7

作者：

Bagmut A.G. ^{[1
]}

Grigorov S.N. ^{[1
]}

Zhuchkov V.A. ^{[1
]}

Kolosov V.Yu. ^{[2
]}

Kosevich V.M. ^{[1
]}

Mel'Nichenko D.V. ^{[1
]}

机构：

[1] National Technical University “Khar’kov Polytechnic Institute”,

[2] Ural State University of Economy,undefined

来源：

Russian Physics Journal | 2007年 / 50卷 / 11期

关键词：

Amorphous Film; Crystallization Front; Thickness Gradient; Orientational Relation; Film Crystallization;

D O I：

10.1007/s11182-007-0157-6

中图分类号：

学科分类号：

摘要：

Methods of transmission electron microscopy and electron diffraction are used to determine the main morphological types of Cr 2 O 3 and V 2 O 3 nanocrystals as well as their evolution in the process of growth in crystallizing amorphous laser condensates during annealing. Films are deposited from laser erosion plasma by sputtering of Cr and V targets in an oxygen atmosphere. Annealing is carried out with an electron beam in the microscope column. Orientational relations are established for conjugation of crystals of various morphological types. The crystallization process in amorphous films with a thickness gradient is investigated. The impurity and size-impurity effects of amorphous state stabilization are revealed. © 2007 Springer Science+Business Media, Inc.

引用

页码：1071 / 1078

页数：7

共 6 条

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