Creep resistance of tin-based lead-free solder alloys

被引:0
|
作者
M. L. Huang
C. M. L. Wu
L. Wang
机构
[1] Dalian University of Technology,Department of Materials Science and Engineering
[2] City University of Hong Kong,Department of Physics and Materials Science
来源
Journal of Electronic Materials | 2005年 / 34卷
关键词
Lead (Pb)-free solder; microstructure; creep; precipitation;
D O I
暂无
中图分类号
学科分类号
摘要
This paper reports on the microstructure-creep property relationship of three precipitation-strengthened tin (Sn)-based lead (Pb)-free solder alloys (Sn-0.7Cu, Sn-3.5Ag, and Sn-3.8Ag-0.7Cu) in bulk samples, together with Sn-37Pb as the alloy for comparison at temperatures of 303 K, 348 K, and 393 K. The creep resistance of these three Sn-based Pb-free solders increases, i.e., the steady-state creep rates decrease, with increasing volume fraction of precipitate phases for the Pb-free solder alloys. Their apparent stress exponents (na ∼ 7.3-17), which are all higher than that of pure Sn, attain higher values with increasing volume fraction of precipitate phases at constant temperature, and with decreasing temperature for the same solder alloy.
引用
收藏
页码:1373 / 1377
页数:4
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