Gerentology of Silicon Integrated Circuits

被引：0
|
作者：
Gorlov M.I. [1 ]
Strogonov A.V. [1 ]
机构：
[1] Voronezh State Technical University, Voronezh, 394026
来源：
Russian Microelectronics | 2001年 / 30卷 / 2期
关键词：
Silicon; Service Time; Integrate Circuit; Accelerate Test; Component Aging;
D O I：
10.1023/A:1009490012752
中图分类号：
学科分类号：
摘要：
The lifetime of silicon ICs in relation to material and component aging is discussed. The service time of the circuits was predicted from accelerated tests. The lifetime of circuits of series 106, 134, 1804, 582, and 136 was evaluated from parameter failures with the Box-Jenkins model.
引用
收藏
页码：125 / 136
页数：11
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