The possibility of direct measurement of phases in X-ray diffraction analysis

被引：0

作者：

Namiot V.A. ^{[1
]}

机构：

[1] Department of Microelectronics, Research Institute of Nuclear Physics, Moscow State University, Vorob'evy Gory, Moscow

来源：

Biophysics | 2010年 / 55卷 / 1期

基金：

俄罗斯基础研究基金会;

关键词：

Reflection phase measurement; X-ray diffraction analysis;

D O I：

10.1134/S000635091001001X

中图分类号：

学科分类号：

摘要：

A method for direct experimental measurement of phases in X-ray diffraction analysis has been developed. The phases can be determined using a special way of holographic recording (called here autoholography) in which the rays scattered on an object completely identical to the object under study-but displaced and rotated relative to it in a definite way-serve as a reference beam. The objects must not necessarily be regular crystals. In principle, autoholography does not require particularly high coherence of radiation, inasmuch as the reference beam itself provides for some extent of compensation. Therefore, x-rays used in conventional diffraction analysis are well suited for autoholography. © 2010 Pleiades Publishing, Ltd.

引用

页码：1 / 4

页数：3