Ferromagnetism in laser-deposited GaMnAs layers

被引:2
作者
O. V. Vikhrova
Yu. A. Danilov
E. S. Demidov
B. N. Zvonkov
V. I. Kovalev
Z. E. Kun’kova
V. V. Podol’skii
M. V. Sapozhnikov
A. I. Suchkov
M. P. Temiryazeva
机构
[1] Nizhni Novgorod State University,Physicotechnical Research Institute
[2] Russian Academy of Sciences,Institute for Physics of Microstructures
[3] Nizhni Novgorod State University,Institute of Radio Engineering and Electronics (Fryazino Branch)
[4] Russian Academy of Sciences,Institute of High
[5] Russian Academy of Sciences,Purity Substances
关键词
GaAs; Sample Plane; Metal Organic Vapor Phase Epitaxy; Curie Tempera; Electron Spin Reso;
D O I
10.3103/S106287380701008X
中图分类号
学科分类号
摘要
The properties of the GaMnAs layers grown by laser deposition on semi-insulating GaAs(100) substrates at temperatures from 300 to 650°C have been investigated. A strong anisotropy of the hysteretic curve of the angle of rotation of the plane of polarization with a change in the magnetic field direction in the sample plane was found during investigation of the magneto-optical Kerr effect (300 K). The domain structure in GaMnAs layers has been observed for the first time at room temperature by magnetic-force microscopy.
引用
收藏
页码:32 / 34
页数:2
相关论文
共 44 条
[31]   Radiative and nonradiative recombination in the active layers of high-power InGaAs/GaAs/AlGaAs laser diodes [J].
V. V. Kabanov ;
Ye. V. Lebiadok ;
G. I. Ryabtsev ;
A. S. Smal ;
M. A. Shchemelev ;
D. A. Vinokurov ;
S. O. Slipchenko ;
Z. N. Sokolova ;
I. S. Tarasov .
Semiconductors, 2012, 46 :1316-1320
[32]   Current injection laser oscillation in TlInGaAs/GaAs double quantum well diodes with InGaP cladding layers [J].
Fuiwara, A ;
Mukai, T ;
Matsumoto, T ;
Hasegawa, S ;
Asahi, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2005, 44 (28-32) :L1002-L1004
[33]   Laser Assisted Surface Photovoltage Spectroscopy: A New Tool for an Accurate Determination of the Bandgap of Semiconductor Epitaxial Layers [J].
Jana, Dipankar ;
Porwal, S. ;
Sharma, T. K. ;
Kumar, Shailendra ;
Oak, S. M. .
PHYSICS OF SEMICONDUCTOR DEVICES, 2014, :787-789
[34]   Threshold of inelastic strain formation in Si and GaAs surface layers under multiple pulsed laser irradiation [J].
S. V. Vintsents ;
A. V. Zoteev ;
G. S. Plotnikov .
Semiconductors, 2002, 36 :841-844
[35]   Laser scattering defects in MBE-grown GaAs epitaxial layers related to dislocations in semi-insulating substrates [J].
Kiyama, M ;
Mukai, H ;
Yoshida, H ;
Sakurada, T ;
Nakai, R .
JOURNAL OF CRYSTAL GROWTH, 2000, 210 (1-3) :212-215
[36]   MOVPE Growth of Smooth and Homogeneous Al0.8Ga0.2N:Si Superlattices as UVC Laser Cladding Layers [J].
Kuhn, Christian ;
Simoneit, Tino ;
Martens, Martin ;
Markurt, Toni ;
Enslin, Johannes ;
Mehnke, Frank ;
Bellmann, Konrad ;
Schulz, Tobias ;
Albrecht, Martin ;
Wernicke, Tim ;
Kneissl, Michael .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2018, 215 (13)
[37]   Efficient method and layer design for calibrating compositions and growth rates of AlGaInP layers in 660-nm laser diodes grown by MOCVD [J].
Kim, B ;
Cho, SH ;
Shin, Y ;
Kang, DH ;
Kim, Y ;
Park, Y .
JOURNAL OF CRYSTAL GROWTH, 2005, 285 (03) :327-332
[38]   Effective passivation and high-performance metal-oxide-semiconductor devices using ultra-high-vacuum deposited high-κ dielectrics on Ge without interfacial layers [J].
Chu, L. K. ;
Chu, R. L. ;
Lin, T. D. ;
Lee, W. C. ;
Lin, C. A. ;
Huang, M. L. ;
Lee, Y. J. ;
Kwo, J. ;
Hong, M. .
SOLID-STATE ELECTRONICS, 2010, 54 (09) :965-971
[39]   Thermal stable laser produced low-ohmic contact to nanometer p-GaAs layers of barrier structures for fast optoelectronics devices [J].
Baranetz, SV ;
Dikiy, SP ;
Fedorenko, LL ;
Kaganovich, EB ;
Svechnikov, SV ;
Antonov, VA .
OPTICAL ORGANIC AND SEMICONDUCTOR INORGANIC MATERIALS, 1997, 2968 :144-148
[40]   1.3μm InAs/GaAs quantum-dot laser monolithically grown on Si substrates using InAlAs/GaAs dislocation filter layers [J].
Chen, S. ;
Tang, M. ;
Wu, J. ;
Jiang, Q. ;
Dorogan, V. G. ;
Benamara, M. ;
Mazur, Y. I. ;
Salamo, G. J. ;
Seeds, A. ;
Liu, H. .
2014 24TH IEEE INTERNATIONAL SEMICONDUCTOR LASER CONFERENCE (ISLC 2014), 2014, :88-89