A step toward next-generation nanoimprint lithography: extending productivity and applicability

被引:0
|
作者
Jong G. Ok
Young Jae Shin
Hui Joon Park
L. Jay Guo
机构
[1] Seoul National University of Science and Technology,Department of Mechanical and Automotive Engineering
[2] University of Pennsylvania,Department of Electrical and Systems Engineering
[3] Ajou University,Division of Energy Systems Research
[4] University of Michigan,Department of Mechanical Engineering; Electrical Engineering and Computer Science
来源
Applied Physics A | 2015年 / 121卷
关键词
PDMS; Nanoimprint Lithography; Exciton Diffusion Length; Flexible Mold; Imprint Structure;
D O I
暂无
中图分类号
学科分类号
摘要
Because of its unique principle based on mechanical deformation, nanoimprint lithography (NIL) has been playing an important role for nanopatterning and nanofabrication beyond the limit of conventional optical lithography. Many diverse fields involving electronics, photonics, and energy engineering have all shown significant increase in utilization of nanopattern structures, particularly in large areas and at submicron scales. To meet this demand, expanding the realm of NIL toward more scalable and versatile patterning technology is in high demand. In this feature article, we give an overview of how NIL can extend productivity and applicability by addressing three key issues: continuous NIL for more scalable nanopatterning, large-area mold fabrications, and novel resist engineering.
引用
收藏
页码:343 / 356
页数:13
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