Melt nonstoichiometry and defect structure of ZnGeP2 crystals

被引:0
作者
G. A. Verozubova
A. Yu. Trofimov
E. M. Trukhanov
A. V. Kolesnikov
A. O. Okunev
Yu. F. Ivanov
P. R. J. Galtier
S. A. Said Hassani
机构
[1] Russian Academy of Sciences,Institute of Monitoring of Climatic and Ecological Systems, Siberian Branch
[2] Russian Academy of Sciences,Institute of Semiconductor Physics, Siberian Branch
[3] Novgorod State University,Institute of High
[4] Russian Academy of Sciences,Current Electronics, Siberian Branch
[5] Groupe d’Etude de la Matière Condensée (GEMaC) UMR 8635 CNRS-Université de Versailles-Saint Quentin,undefined
来源
Crystallography Reports | 2010年 / 55卷
关键词
Crystallography Report; Dark Field Image; Growth Axis; Crystallization Front; Cold Zone;
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摘要
The defect structure of ZnGeP2 crystals grown from a melt by the vertical Bridgman method has been investigated. A deviation of the melt composition from stoichiometric leads to the formation of striations and the inclusions of other phases which are observed as structures (chains) oriented parallel to the growth axis. According to the microanalysis data, the inclusion composition corresponds to a mixture of ZnGeP2, Zn3P2, and Ge. Nanoinclusions of germanium phosphide are detected by transmission electron microscopy. X-ray topography reveals defects of four types. The main defects in the central part of an ingot are related to the composition fluctuations, and the newly formed dislocations are basically single ones. Most dislocations are formed at the crystal periphery.
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页码:65 / 70
页数:5
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