Uncertainty Estimation for Performance Evaluation of a Confocal Microscope as Metrology Equipment

被引:0
作者
O. Guarneros
J. de Vicente
M. Maya
J. L. Ocaña
C. Molpeceres
J. J. García-Ballesteros
S. R. Rodríguez
H. M. Duran
机构
[1] University of San Luis Potosí,Mechanical and Electrical Department
[2] Technical University of Madrid,Laboratory of Metrology and Metrotechnic, Department of Applied Physics
[3] Technical University of Madrid,Laser Center
来源
MAPAN | 2014年 / 29卷
关键词
Metrology; Confocal microscopy; Uncertainty; Traceability;
D O I
暂无
中图分类号
学科分类号
摘要
Both in industry and research, the quality control of micrometric manufactured parts is based on the measurement of parameters whose traceability is sometimes difficult to guarantee. In some of these parts, the confocal microscopy shows great aptitudes to characterize a measurand qualitatively and quantitatively. The confocal microscopy allows the acquisition of 2D and 3D images that are easily manipulated. Nowadays, this equipment is manufactured by many different brands, each of them claiming a resolution probably not in accord to their real performance. The Laser Center (Technical University of Madrid) has a confocal microscope to verify the dimensions of the micro mechanizing in their own research projects. The present study pretends to confirm that the magnitudes obtained are true and reliable. To achieve this, a methodology for confocal microscope calibration is proposed, as well as an experimental phase for dimensionally valuing the equipment by 4 different standard positions, with its seven magnifications and the six objective lenses that the equipment currently has, in the x–y and z axis. From the results the uncertainty will be estimated along with an effect analysis of the different magnifications in each of the objective lenses.
引用
收藏
页码:29 / 42
页数:13
相关论文
共 14 条
  • [1] Yadav S(2009)Evaluation of laboratory performance through interlaboratory comparison MAPAN J. Metrol. Soc. India 24 125-138
  • [2] Bandyopadhyay T(2001)Quality control and process observation for the micro assembly Measurement 30 1-3
  • [3] Pfeifer R(2006)Uncertainty and traceable calibration—how modern measurement concepts improve product quality in process industry Measurement 39 612-620
  • [4] Freudenberg G(2011)Micro 3D measurement method using SEM MAPAN J. Metrol. Soc. India 26 69-78
  • [5] Dussler B(2011)Present problems in coordinate metrology for nano and micro scale measurements MAPAN J. Metrol. Soc. India 26 3-14
  • [6] Bröcher J(2002)Inter-comparison of scanning probe microscopes Precis. Eng. 26 296-305
  • [7] Wirandi A(2011)Practical interpretation of metrological traceability on gauge block as to VIM 3 MAPAN J. Metrol. Soc. India 1 79-86
  • [8] Lauber Y(2010)Application of a commercially available displacement measuring interferometer to line scale measurement and uncertainty of measurement MAPAN J. Metrol. Soc. India 25 259-264
  • [9] Arai K(undefined)undefined undefined undefined undefined-undefined
  • [10] Takamasu R(undefined)undefined undefined undefined undefined-undefined