Effects of the lateral ordering of self-assembled SiGe nanoislands grown on strained Si1 − xGex buffer layers

被引:0
|
作者
V. V. Strelchuk
A. S. Nikolenko
P. M. Lytvyn
V. P. Kladko
A. I. Gudymenko
M. Ya. Valakh
Z. F. Krasilnik
D. N. Lobanov
A. V. Novikov
机构
[1] National Academy of Sciences of Ukraine,V. Lashkaryov Institute of Semiconductor Physics
[2] Russian Academy of Sciences,Institute for Physics of Microstructures
来源
Semiconductors | 2012年 / 46卷
关键词
Buffer Layer; SiGe Layer; Nonuniform Field; Strong Diffusion; Interdiffusion Process;
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中图分类号
学科分类号
摘要
Atomic-force microscopy, micro-Raman spectroscopy, and high resolution X-ray diffraction are applied to study the spatial ordering in single layers of SiGe nanoislands grown on a strained Si1 − xGex buffer sublayer. It is shown that, apart from stimulating the spatial ordering of nanoislands, the introduction of a Si1 − xGex sublayer leads to an enhanced role for interdiffusion processes. An unusually high increase in the volume of nanoislands in the process of the epitaxy is related to the anomalously strong diffusion from the buffer sublayer into the islands that is induced by nonuniform fields of elastic strains. The anisotropy of the islands shape and spatial ordering is discussed in terms of the anisotropy of the diffusion processes in spatially nonuniform fields of elastic strains.
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页码:647 / 654
页数:7
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