Diffractometry of wire-drawing dies with local flaws

被引：0
|
作者：
V. A. Tarlykov
机构：
[1] St. Petersburg State Institute of Fine Mechanics and Optics (Technical University),
来源：
Russian Journal of Nondestructive Testing | 2000年 / 36卷
关键词：
Diffraction Pattern; Nondestructive Test; Local Flaw; Modulation Depth; Diffraction Ring;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The problem of measurement of flaw dimensions in diamond wire-drawing dies is discussed. An analytical expression for the modulation depth of diffraction rings as a function of the flaw dimension is given, and analytical calculations are compared to numerical calculations for various types of flaws. Changes in the symmetry of the diffraction pattern due to a local flaw on the hole surface are described.
引用
收藏
页码：276 / 281
页数：5
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