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Improving Dielcometer Reliability
被引：0
作者：
Yu. V. Podgornyi
机构：
来源：
Measurement Techniques
|
2003年
/
46卷
关键词：
dielcometer;
dielectric permeativity;
conductivity;
parametric modulation;
varicap;
tuned circuit;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The paper discusses the effects of parasitic quality-factor modulation in a tuned circuit arising on parametric modulation and influencing a capacitance-sensor analyzer. Varicaps may be used for parametric modulation of a semiconductor capacitance in order to improve not only the reliability but also the accuracy of a dielcometric analyzer.
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页码：702 / 709
页数：7
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