Refractive index change detection based on porous silicon microarray

被引:0
|
作者
Weirong Chen
Zhenhong Jia
Peng Li
Guodong Lv
Xiaoyi Lv
机构
[1] Xinjiang University,School of Physical Science and Technology
[2] Xinjiang University,School of Information Science and Engineering
[3] The First Teaching Hospital of Xinjiang Medical University,undefined
来源
Applied Physics B | 2016年 / 122卷
关键词
Porous Silicon; Array Element; Effective Refractive Index; Defect Mode; Refractive Index Change;
D O I
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中图分类号
学科分类号
摘要
By combining photolithography with the electrochemical anodization method, a microarray device of porous silicon (PS) photonic crystal was fabricated on the crystalline silicon substrate. The optical properties of the microarray were analyzed with the transfer matrix method. The relationship between refractive index and reflectivity of each array element of the microarray at 633 nm was also studied, and the array surface reflectivity changes were observed through digital imaging. By means of the reflectivity measurement method, reflectivity changes below 10−3 can be observed based on PS microarray. The results of this study can be applied to the detection of biosensor arrays.
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