Improved Sensitivity of the Refractive Index Sensor Based on a Photonic Crystal Waveguide

In this paper, we used the finite-difference time domain method to analyze the wavelength spectrum as detected at the end of two-dimensional photonic crystal waveguide that contains circle- and ring-shaped silicon rods distributed in an air wafer. A shift of 0.0758 μ\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\upmu $$\end{document}m in the wavelength position of the upper band edge, corresponding to a sensitivity of 758 nm/RIU, was observed. A local defect has been introduced, which produces a very high shift in the cutoff wavelength corresponding to a higher sensitivity of 1490 nm/RIU.