XTEM study of Al doped TiO2 anatase epitaxial films deposited on MgO by pulsed laser deposition

被引：0

作者：

V. S. Teodorescu

M. G. Blanchin

C. Garapon

C. Champeaux

机构：

[1] National Institute for Physics of Materials,Département de Physique des Matériaux, CNRS UMR 5586

[2] Université Claude-Bernard,Laboratoire de Physicochimie des Matériaux Luminescents, CNRS UMR 5620

[3] Université Claude-Bernard,Laboratoire de Matériaux Céramiques et Traitements des Surfaces, CNRS ESA 6015

[4] Université de Limoges,undefined

来源：

Journal of Materials Science | 1999年 / 34卷

关键词：

Polymer; Microstructure; TiO2; Transmission Electron Microscopy; Optical Property;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Al doped TiO2 anatase films epitaxially grown by Pulsed Laser Deposition (PLD) on MgO single crystal substrates have been studied by cross-section transmission electron microscopy. The main structural features of such films are the columnar morphology of the anatase grains and the formation of a spinel buffer layer at the TiO2/MgO interface. The spinel layer is Al rich and displays a steep gradient in Mg composition. Correlation between the microstructure and the optical properties of the films is presented also.

引用

页码：5469 / 5476

页数：7

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