Characterization of Ultra-Thin Films of Pd Deposited on Au(111)

被引：0
|
作者：
A. Pancotti
P. A. P. Nascente
A. de Siervo
R. Landers
M. F. Carazzolle
D. A. Tallarico
G. G. Kleiman
机构：
[1] Universidade Estadual de Campinas,Departamento de Física Aplicada, Instituto de Física “Gleb Wataghin”
[2] Universidade Federal de São Carlos,Departamento de Engenharia de Materiais
[3] Laboratório Nacional de Luz Síncrotron,undefined
来源：
Topics in Catalysis | 2011年 / 54卷
关键词：
Gold–palladium alloy; X-ray photoelectron diffraction; Synchrotron radiation; Low-energy electron diffraction; Surface alloys; Surface diffusion;
D O I：
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中图分类号：
学科分类号：
摘要：
Ultra-thin films (1 and 3 monolayers) of Pd were deposited on the Au(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), X-ray excited Auger spectroscopy (XAES), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). For the 1 ML Pd film annealed at 450 °C, XPS and XAES results indicated that Pd had diffused into the Au substrate. For the 3 ML Pd film deposited at room temperature, the comparison between experimental and theoretical XPD results indicated approximately 30% of the surface was formed by 2 ML Au layers, and 70% of the surface, by 1 ML Au layers.
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页码：70 / 76
页数：6
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