Investigation of surface properties of treated ITO substrates for organic light-emitting devices

被引:0
作者
Aneta Araźna
Grażyna Kozioł
Kamil Janeczek
Konrad Futera
Wojciech Stęplewski
机构
[1] Tele and Radio Research Institute,
来源
Journal of Materials Science: Materials in Electronics | 2013年 / 24卷
关键词
Contact Angle; Surface Free Energy; Sheet Resistance; Atomic Force Microscopy Micrographs; Cleaning Treatment;
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摘要
In this work, a study of the surface properties of treated indium tin oxide (ITO) substrates is reported. We used three different cleaning treatments among others: washing in an ultrasonic bath of acetone and ethyl alcohol or isopropyl alcohol in room temperature as well as dipping into solution (prepared from NH4OH (25 %), H2O2 (30 %) and distilled water) at 60 °C. The relation between ITO morphology and surface properties has been studied by contact angle, and surface energy measurements as well as the surface roughness of ITO samples evaluation by atomic force microscopy (AFM). Experimental results show that the ITO surface properties are closely related to the treatment methods. The ultrasonic degreasing in acetone and ethyl alcohol yields the highest surface energy (38.5 mJ/m2), brings about the maximum reduction in contact angles and causes the smallest increasing the surface roughness of ITO substrates.
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页码:267 / 271
页数:4
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