The influence of a probe on topographical images in atomic force microscopy

被引：0

作者：

N. G. Tsirkunova

V. E. Borisenko

L. V. Kukharenko

M. V. Gol’tsev

S. A. Chizhik

机构：

[1] Belarusian State University for Informatics and Radio Electronics,Lykov Institute for Heat and Mass Transfer

[2] Belarusian State Medical University,undefined

[3] National Academy of Science,undefined

来源：

Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques | 2009年 / 3卷

关键词：

Atomic Force Microscopy; Atomic Force Microscopy Image; Surface Investigation; Neutron Technique; Biological Object;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Examples of the errors that arose under the studies of metric characteristics of micro- and nanoobjects with atomic force microscopy (AFM) are presented. Degradation of the tip of the probe both under successive scanning of the same part of a sample surface and in the course of a single scan is revealed. AFM images acquired with the probe having twin apexes located at different levels are demonstrated.

引用

页码：730 / 733

页数：3

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