Interfacial Reactions Between In-Sn Solder and Ni-Fe Platings

被引:0
作者
John P. Daghfal
P. J. Shang
Z. Q. Liu
J. K. Shang
机构
[1] Chinese Academy of Science,Shenyang National Laboratory for Materials Science, Institute of Metal Research
[2] University of Illinois at Urbana-Champaign,Department of Materials Science and Engineering
来源
Journal of Electronic Materials | 2009年 / 38卷
关键词
In-Sn solder; Ni-Fe metallization; interface; FeSn; Ni; Sn; faceting;
D O I
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中图分类号
学科分类号
摘要
Interfacial interactions in a Ni-xFe-Sn-In eutectic solder (x = 30 at.%, 55 at.%) have been examined. Transmission and scanning electron microscopy (TEM/SEM) were utilized to investigate the structure, composition, and morphology of the intermetallic compounds (IMCs). Upon reflow, Ni3Sn4 and FeSn2 phases appeared at the interface along with Cu6Sn5 in the solder. Annealing experiments revealed the formation of a bilayer IMC that was Fe-rich adjacent to the Ni-Fe metallization and Ni-rich on the solder side. Kinetic studies established the apparent activation energies for both systems to be 51.8 kJ/mol and 85.1 kJ/mol, for 30 at.% and 55 at.% Fe contents, respectively. In the Fe-rich system, globular Ni3Sn4 crystals were formed upon reflow, but were changed into a cubic/faceted structure after annealing.
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页码:2506 / 2515
页数:9
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