Characterization of MEMS Devices for the Study of Superfluid Helium Films

被引:0
|
作者
M. González
P. Bhupathi
B. H. Moon
P. Zheng
G. Ling
E. Garcell
H. B. Chan
Y. Lee
机构
[1] University of Florida,Department of Physics
来源
Journal of Low Temperature Physics | 2011年 / 162卷
关键词
Superfluid films; MEMS; Low-temperature devices;
D O I
暂无
中图分类号
学科分类号
摘要
Measurements on the mechanical properties of MEMS resonators were performed to characterize such devices at room temperature and low temperatures. Using state-of-the-art silicon integrated circuit technology, we have designed, fabricated, and manufactured resonators consisting of a pair of parallel plates with a well-defined gap whose size can be controlled with a high accuracy down to the sub-micron range. A full study of resonance properties at various pressures was performed at room temperature. We will discuss the details of design, fabrication, and operation. These studies open up a window of opportunities to look for novel phenomena in quantum fluids such as in superfluid 3He films.
引用
收藏
页码:661 / 668
页数:7
相关论文
共 50 条
  • [1] Characterization of MEMS Devices for the Study of Superfluid Helium Films
    Gonzalez, M.
    Bhupathi, P.
    Moon, B. H.
    Zheng, P.
    Ling, G.
    Garcell, E.
    Chan, H. B.
    Lee, Y.
    JOURNAL OF LOW TEMPERATURE PHYSICS, 2011, 162 (5-6) : 661 - 668
  • [2] Characterization of polycrystalline SiC thin films for MEMS applications using surface micromachined devices
    Dunning, J
    Fu, XA
    Rajgopal, S
    Mehregany, M
    Zorman, CA
    SILICON CARBIDE AND RELATED MATERIALS 2003, PTS 1 AND 2, 2004, 457-460 : 1523 - 1526
  • [3] Invar Thin Films for MEMS Bistable Devices
    Ratnayake, Dilan
    Walsh, Kevin M.
    SOUTHEASTCON 2016, 2016,
  • [4] Unified characterization of surfaces and gases in MEMS devices
    Thornberg, SM
    Zavadil, KR
    Ohlhausen, JA
    Keenan, MR
    Peebles, DE
    Knorovsky, GA
    MacCallum, DO
    Nowak-Neely, BM
    Abraham, IC
    Plass, RA
    RELIABILITY, TESTING AND CHARACTERIZATION OF MEMS/MOEMS III, 2004, 5343 : 186 - 193
  • [5] Characterization of piezoelectric polymer composites for MEMS devices
    C V MADHUSUDHANA RAO
    G PRASAD
    Bulletin of Materials Science, 2012, 35 : 579 - 584
  • [6] Characterization of piezoelectric polymer composites for MEMS devices
    Rao, C. V. Madhusudhana
    Prasad, G.
    BULLETIN OF MATERIALS SCIENCE, 2012, 35 (04) : 579 - 584
  • [7] Piezoelectric Thin Films Characterization for MEMS Applications
    Al Ahmad, Mahmoud
    Plana, R.
    2007 ASIA PACIFIC MICROWAVE CONFERENCE, VOLS 1-5, 2007, : 514 - 517
  • [8] Investigation of RF sputtered PSG films for MEMS and semiconductor devices
    Bhatt, Vivekanand
    Chandra, Sudhir
    MICROELECTRONIC ENGINEERING, 2009, 86 (01) : 24 - 32
  • [9] AFM Nanotribomechanical Characterization of Thin Films for MEMS Applications
    Birleanu, Corina
    Pustan, Marius
    Serdean, Florina
    Merie, Violeta
    MICROMACHINES, 2022, 13 (01)
  • [10] Study on shock resistance of MEMS Devices with different Stoppers
    Jiang, Tao
    Wei, Yun
    Yao, Sai
    Zhou, Jian
    MICRO-NANO TECHNOLOGY XV, 2014, 609-610 : 825 - 830