Optimum quadratic step-stress accelerated life test plan for Weibull distribution under type-I censoring

被引：3

作者：

Chandra N. ^{[1
]}

Khan M.A. ^{[1
]}

Gopal G. ^{[2
]}

机构：

[1] Department of Statistics, Ramanujan School of Mathematical Sciences, Pondicherry University, Puducherry

[2] Madras School of Economics, Chennai

来源：

International Journal of System Assurance Engineering and Management | 2017年 / 8卷 / Suppl 2期

关键词：

Accelerated life testing; Asymptotic variance; Cumulative exposure model; Maximum likelihood estimate; Quadratic relationship; Type-I censoring; Weibull distribution;

D O I：

10.1007/s13198-016-0473-8

中图分类号：

学科分类号：

摘要：

This paper presents the optimum stress changing times for 3-step, step stress accelerated life testing under the cumulative exposure model with type-I censoring. The lifetimes of test units are assumed to follow Weibull distribution. The scale parameter of the Weibull failure time at constant stress level is assumed to be a log-quadratic function of the stress level. We derive an optimum test plans to minimize the asymptotic variance of maximum likelihood estimator of given pth percentile of the distribution at a design stress. The optimum test plan based on simulated observations is illustrated through a numerical example. The maximum likelihood estimates and asymptotic interval estimates are obtained using R software. © 2016, The Society for Reliability Engineering, Quality and Operations Management (SREQOM), India and The Division of Operation and Maintenance, Lulea University of Technology, Sweden.

引用

页码：585 / 591

页数：6

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