The balanced filter method for studying the hard X-ray spectrum of the plasma focus device

被引：0
|
作者：
A. K. Dulatov
P. S. Krapiva
B. D. Lemeshko
Yu. V. Mikhailov
I. N. Moskalenko
I. A. Prokuratov
A. N. Selifanov
机构：
[1] Dukhov All-Russia Research Institute of Automatics,
来源：
Instruments and Experimental Techniques | 2015年 / 58卷
关键词：
Energy Range; Spectral Sensitivity; Plasma Focus; Semiconductor Detector; Entrance Window;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A method for measuring hard X-ray spectra in an energy range of 10–88 keV using the difference filter method and semiconductor detectors is described. The method is applied for measuring the hard X-ray spectrum of a plasma-focus device with a stored energy of up to 3.7 kJ. The characteristic features of the spectrum of the plasma-focus devices are given. Based on this method, a spectrometer for measuring the hard X-ray spectrum of high-power pulse devices is designed at the All-Russia Research Institute of Automatics.
引用
收藏
页码：774 / 780
页数：6
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