A new facility for the measurement of the normal spectral emissivity of solid materials for high-temperature applications in the thermal steady state was developed at the Bundeswehr University of Munich. The measurements are performed under atmospheric conditions. The facility covers the temperature range between 500∘C\documentclass[12pt]{minimal}
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\begin{document}$$500\,^{\circ }\hbox {C}$$\end{document} and 1350∘C\documentclass[12pt]{minimal}
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\begin{document}$$1350\,^{\circ }\hbox {C}$$\end{document} and wavelengths between 0.6μm\documentclass[12pt]{minimal}
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\begin{document}$$0.6\,\upmu \hbox {m}$$\end{document} and 15μm\documentclass[12pt]{minimal}
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\begin{document}$$15\,\upmu \hbox {m}$$\end{document}. The principle of operation involves the spectral comparison of a test sample with a reference blackbody and the sample surface temperature determination with a numerical spectral ratio calculation. The optical characteristics of the blackbody and the sample surface temperature determination are discussed in detail. Furthermore, measurement results of the quasi-reference material silicon-carbide under steady-state conditions are presented to validate the measurement method.
