In-situ High Temperature X-ray Diffraction Study of the Am-O System

被引:0
作者
E. Epifano
R. C. Belin
J C Richaud
R. Vauchy
M. Strach
F. Lebreton
T. Delahaye
C. Guéneau
P. M. Martin
机构
[1] CEA,
[2] DEN/DTEC/SECA/LCC,undefined
[3] CEA,undefined
[4] DEN/DRCP/SERA/LCAR,undefined
[5] CEA,undefined
[6] DEN/DPC/SCCME/LM2T,undefined
关键词
D O I
10.1557/adv.2017.200
中图分类号
学科分类号
摘要
In the frame of minor actinide recycling, (U,Am)O2 are promising transmutation targets. To assess the thermodynamic properties of the U-Am-O system, it is essential to have a thorough knowledge of the binary phase diagrams, which is difficult due to the lack of thermodynamic data on the Am-O system. Nevertheless, an Am-O phase diagram modelling has been recently proposed by Gotcu. Here, we show a recent investigation of the Am-O system using in-situ High Temperature X-ray Diffraction under controlled atmosphere. By coupling our experimental results with the thermodynamic calculations based on the Gotcu model, we propose for the first time a relation between the lattice parameter and the departure from stoichiometry.
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页码:4133 / 4137
页数:4
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