Frequency dependence in the piezoresponse force microscopy of dense piezoceramics

被引：2

作者：

Bunin M.A. ^{[1
,2
]}

Rybyanets A.N. ^{[2
]}

Fedorovskiy A.E. ^{[1
]}

Sukhomlinov D.I. ^{[1
]}

Bunina O.A. ^{[2
]}

机构：

[1] Faculty of Physics, Southern Federal University, Rostov-on-Don

[2] Research Institute of Physics, Southern Federal University, Rostov-on-Don

来源：

Bulletin of the Russian Academy of Sciences: Physics | 2016年 / 80卷 / 11期

关键词：

Scanning probe microscopy;

D O I：

10.3103/S1062873816090057

中图分类号：

学科分类号：

摘要：

Images of the piezoresponses (PRs) in the frequency range of 15–2500 kHz are obtained for dense polarized PCR-1 piezoceramics. It is shown that in the region of resonance, the dependence of PR amplitudes on frequency includes a function that changes its sign at the resonance frequency. Possible reasons for the inversion of PR contrast in the narrow range of frequencies near 725 kHz are discussed. © 2016, Allerton Press, Inc.

引用

页码：1396 / 1398

页数：2

共 16 条

[1]

Yin Q., Zhu B., Zeng H., Microstructure, Property and Processing of Functional Ceramics, (2009)

[2]

Rybyanets A.N., Rybyanets A.A., IEEE Trans. Ultrason., Ferroelectr. Freq. Control, 58, 9, (2011)

[3]

Topolov V.Y., Bowen C.R., Electromechanical Properties in Composites Based on Ferroelectrics, (2009)

[4]

Uchino K., Zuang Y., Ural S.O., J. Adv. Dielectr., 1, (2011)

[5]

Yin Q., Zhu B., Zeng H., Microstructure, Property and Processing of Functional Ceramics, (2009)

[6]

Proksch R., Kalinin S., Asylum Research Appl. Note, Santa Barbara, (2014)

[7]

Garsia R., Perez R., Surf. Sci. Rep., 47, (2002)

[8]

Jesse S., Mirman B., Kalinin S.V., Appl. Phys. Lett., 89, (2006)

[9]

Ivry Y., Chu D.P., Durkan C., Appl. Phys. Lett., 94, (2009)

[10]

Seal K., Jesse S., Rodriguez B.J., Et al., Appl. Phys. Lett., 91, (2007)

← 1 2 →