Deposition of thick YBa2Cu3O7−x films on sapphire with a sublayer of cerium oxide

被引：0

作者：

E. K. Hollmann

V. I. Gol’drin

V. E. Loginov

D. A. Plotkin

S. V. Razumov

A. V. Tumarkin

机构：

[1] St. Petersburg State Electrical Engineering University,

来源：

Technical Physics Letters | 1997年 / 23卷

关键词：

Oxide; Cerium; Sapphire; Cerium Oxide; Structural Perfection;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

A report is made on the results of experiments to prepare YBa2Cu3O7−x films up to 2.6 μm thick on Al2O3/CeO2 with good structural perfection and electrophysical parameters.

引用

页码：186 / 187

页数：1

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