Deposition of thick YBa2Cu3O7−x films on sapphire with a sublayer of cerium oxide

被引：0
作者：
E. K. Hollmann
V. I. Gol’drin
V. E. Loginov
D. A. Plotkin
S. V. Razumov
A. V. Tumarkin
机构：
[1] St. Petersburg State Electrical Engineering University,
来源：
Technical Physics Letters | 1997年 / 23卷
关键词：
Oxide; Cerium; Sapphire; Cerium Oxide; Structural Perfection;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A report is made on the results of experiments to prepare YBa2Cu3O7−x films up to 2.6 μm thick on Al2O3/CeO2 with good structural perfection and electrophysical parameters.
引用
收藏
页码：186 / 187
页数：1
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