Antireflection properties of erbium oxide films

被引:0
作者
V. A. Rozhkov
M. A. Rodionov
机构
[1] Samara State University,
来源
Technical Physics Letters | 2005年 / 31卷
关键词
Oxide; Silicon; Reflection; Wavelength Range; Oxide Film;
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摘要
We have studied the optical transmission spectrum of a surface film of erbium oxide and evaluated the effect of clarification for the surface of a silicon-based photovoltaic converter with an antireflection coating of this material. It is established that erbium oxide films are highly transparent in a broad wavelength range from 250 to 1050 nm and ensure a decrease in the coefficient of reflection of a silicon surface down to 1–4.5%. The antireflection coating of erbium oxide increases the short-circuit photocurrent of the silicon-based photovoltaic converter by more than 38%.
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页码:77 / 78
页数:1
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