共 106 条
[1]
Oberhammer J.(2005)BCB contact printing for patterned adhesive full-wafer bonded 0-level packages J. Microelectromech. Syst. 14 419-425
[2]
Stemme G.(2007)Scanning white light interferometry in quality control of single-point tape automated bonding Microelectron. Eng. 84 114-123
[3]
Kassamakov I.V.(2008)Wire bonding using insulated wire and new challenges in wire bonding Microelectron. Int. 25 9-14
[4]
Seppnen H.O.(2006)Mechanical reliability of Au and Cu wire bonds to Al, Ni/Au and Ni/Pd/Au capped Cu bond pads Microelectron. Reliab. 46 1315-1325
[5]
Oinonen M.J.(2004)Surface oxide evolution on Al-Si bond wires for high-power RF applications Microelectron. Eng. 75 111-116
[6]
Hggstrm E.O.(2007)A new bonding-tool solution to improve stitch bondability Microelectron. Eng. 84 173-179
[7]
Sterberg J.M.(2007)Two capillary solutions for ultra-fine-pitch wire bonding and insulated wire bonding Microelectron. Eng. 84 362-367
[8]
Aaltonen J.P.(2006)A numerical failure analysis on lead breakage issues of ultra fine pitch flip chip-on-flex and tape carrier packages during chip/film assembly process Microelectron. Reliab. 46 487-495
[9]
Saarikko H.(2006)Relationship between mechanical properties and microstructure of ultra-fine gold bonding wires Mech. Mater. 38 119-127
[10]
Radivojevic Z.P.(2006)Investigation of recrystallization and grain growth of copper and gold bonding wires Metall. Mater. Trans A, Phys. Metall. Mater. Sci. 37 3085-3097