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- [28] X-Ray Diffraction Analysis Analyze the Error of Residual Stress by Using Mathematical Statistics ADVANCES IN MECHATRONICS TECHNOLOGY, 2011, 43 : 687 - 690
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- [30] Characterization of ZnSe/GaAs(001) heteroepitaxial interfaces by X-ray reflectivity measurement JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (6A): : 3475 - 3480